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Tuojie provides cutting-edge professional testing equipment and technical services,
Our main products include ultra-deep microscope, image measuring instrument,
white light interferometer, customized microscope system, etc.
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  • Ultra-depth of field digital microscope MX-E1 series
  • Fully automatic image measuring instrument MF-3000 series
  • White light interferometer MT-W1 series
  • Customized microscope system
  • Ultra-depth of field digital microscope MX-E1 series

    Ultra-deep depth of field imaging / Integrated multiple functions / 2D, 3D measurement

    The MX-E1 ultra-deep field digital microscope is a professional precision inspection device that integrates three core functions: high-definition microscopic observation, high-definition image capture, and intelligent precise measurement. It is easy and efficient to operate, allowing quick completion of observation, imaging, and data measurement without requiring complex adjustments. It provides a high-precision, high-efficiency, and highly convenient microscopic observation solution for industrial production and scientific research.

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  • Fully automatic image measuring instrument MF-3000 series

    High-precision measurement / Simple and efficient operation / One-click measurement

    The MF-3000 fully automatic image measuring instrument boasts one-click intelligent operation and combines three core advantages: efficient detection, high precision, and stable operation. It eliminates the need for professional measurement technicians, completely avoiding manual detection errors. It supports one-click batch detection of over 1,000 workpieces and more than 5,000 dimensions, significantly reducing measurement time, significantly improving quality inspection efficiency, and ensuring high uniformity in product quality.

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  • White light interferometer MT-W1 series

    Maximum accuracy of 0.1nm / Auto-focusing / Auto-leveling

    The MT-W1 white light interferometer, through the analysis of interference fringes, can achieve three-dimensional topography characterization with nanometer-level resolution, accurately capturing key parameters such as height differences, roughness, step heights, and film thicknesses on the sample surface. It provides a reliable microscopic analysis basis for precision manufacturing and cutting-edge scientific research. Its application scenarios cover multiple fields including semiconductor wafers, MEMS devices, precision optical components, precision machined parts, and coating materials.

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  • Customized microscope system

    Highly customized / Covering the entire industry / Compatible with all scenarios

    We provide our customers with highly customized non-standard microscope system development services. In response to customers' personalized needs in special observation scenarios, complex sample structures, and stringent detection standards, we modularize and agilize core capabilities such as confocal microscopy, white light interferometry, and super-resolution imaging, creating tailored microscopic observation and detection solutions for non-standard detection challenges in different industries.

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    1. Products
    2. Ultra-depth of field digital microscope MX-E1 series
    3. Fully automatic image measuring instrument MF-3000 series
    4. White light interferometer MT-W1 series
    5. Customized microscope system
    1. Application
    2. PCB
    3. Semiconductor
    4. Cutting Tools Industry
    5. Materials Industry
    6. New Energy Industry
    7. Liquid Crystal Industry
    8. Metal processing
    9. Biological Assay
    10. Non-Standard Microscopic Testing
    1. Support
    2. Prototype Demonstration/Testing
    3. Prototype Feedback
    1. News
    2. Company News
    3. Industry Cases
    4. Knowledge
    5. Popular Science Video
    1. About us
    2. Company Profile
    3. Corporate Culture
    4. Development History
    5. Honors
    6. Partners
    7. Careers
    1. Contact us
    2. Contact
    3. Download

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