White light interferometer MT-W1 series

Maximum accuracy of 0.1nm / Auto-focusing / Auto-leveling

Roughness

microtopography

step height

planarity

The MT-W1 white light interferometer, through the analysis of interference fringes, can achieve three-dimensional topography characterization with nanometer-level resolution, accurately capturing key parameters such as height differences, roughness, step heights, and film thicknesses on the sample surface. It provides a reliable microscopic analysis basis for precision manufacturing and cutting-edge scientific research. Its application scenarios cover multiple fields including semiconductor wafers, MEMS devices, precision optical components, precision machined parts, and coating materials.

Product Quotation

Product Features

Video Introduction

Application