Ultra-depth of field digital microscope MX-E1 series
The MX-E1 ultra-deep field digital microscope is a professional precision inspection device that integrates three core functions: high-definition microscopic observation, high-definition image capture, and intelligent precise measurement. It is easy and efficient to operate, allowing quick completion of observation, imaging, and data measurement without requiring complex adjustments. It provides a high-precision, high-efficiency, and highly convenient microscopic observation solution for industrial production and scientific research.
Fully automatic image measuring instrument MF-3000 series
The MF-3000 fully automatic image measuring instrument boasts one-click intelligent operation and combines three core advantages: efficient detection, high precision, and stable operation. It eliminates the need for professional measurement technicians, completely avoiding manual detection errors. It supports one-click batch detection of over 1,000 workpieces and more than 5,000 dimensions, significantly reducing measurement time, significantly improving quality inspection efficiency, and ensuring high uniformity in product quality.
White light interferometer MT-W1 series
The MT-W1 white light interferometer, through the analysis of interference fringes, can achieve three-dimensional topography characterization with nanometer-level resolution, accurately capturing key parameters such as height differences, roughness, step heights, and film thicknesses on the sample surface. It provides a reliable microscopic analysis basis for precision manufacturing and cutting-edge scientific research. Its application scenarios cover multiple fields including semiconductor wafers, MEMS devices, precision optical components, precision machined parts, and coating materials.
Customized microscope system
We provide our customers with highly customized non-standard microscope system development services. In response to customers' personalized needs in special observation scenarios, complex sample structures, and stringent detection standards, we modularize and agilize core capabilities such as confocal microscopy, white light interferometry, and super-resolution imaging, creating tailored microscopic observation and detection solutions for non-standard detection challenges in different industries.

2024-09-30Learn more

2024-10-08
Tuojie (Xi'an) Optoelectronic Technology Co., Ltd., a national high-tech enterprise established in 2020, won the Excellent Award in the High end Equipment Manufacturing Growth Group in this competition with its independently developed "Super Depth of Field 3D Microscope" project.
View more2026-09-08
Double expo, diving deep into optoelectronics! Tuojie (Xi'an) Optoelectronics Technology Co., Ltd. makes a big splash at two major industry events, showcasing our full range of precision testing equipment, launching new products, and presenting custom solutions. We warmly invite colleagues from all fields to visit our booth, have face-to-face chats, test samples on-site, and explore new tech opportunities together!
2026-03-11
Opening a New Chapter, Envisioning the Future! The 2026 Shanghai Optical Fair in Munich is set to grandly commence on March 18, 2026, at the Shanghai New International Expo Center. Tuoji (Xi'an) Optoelectronic Technology Co., Ltd. cordially invites you to attend the event, explore technological innovations, and seek collaborative business opportunities together.
2025-11-13
Focusing on high-quality regional economic development and building bridges for international industrial cooperation, Shaanxi has recently ushered in a heavyweight moment of industrial cooperation - SICC Shaanxi International Communication Center and 2025 China (Shaanxi) Multinational Corporation Industrial Cooperation Conference are held simultaneously in Shaanxi. Zhao Yide, Secretary of the Provincial Party Committee, Xi Guohua, Chairman of CITIC Group, Wu Sitian, Chairman of the UK China Business Association, and Hans Peter Friedrich, former Vice Speaker of the German Federal Parliament and Chairman of the East German Economic Cooperation Committee, attended the conference and delivered speeches.











